Title :
Do chip size limits exist for DCA?
Author :
Schubert, Andreas ; Dudek, Rainer ; Leutenbauer, Rudolf ; Döring, Ralf ; Kloeser, Joachim ; Oppermann, H. ; Michel, Bernd ; Reichl, Herbert ; Baldwin, Daniel F. ; Qu, Jianmin ; Sitaraman, Suresh K. ; Swaminathan, Madhavan ; Wong, C.P. ; Tummala, Rao
Author_Institution :
Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
fDate :
10/1/1999 12:00:00 AM
Abstract :
Solder joints, the most widely used flip chip on board (FCOB) interconnects, have a relatively low structural compliance due to the large thermal expansion mismatch between silicon die and the organic substrate. The coefficient of thermal expansion (CTE) of the printed wiring board (PWB) is almost an order of magnitude greater than that of the integrated circuit (IC). Under operating and testing conditions, this mismatch subjects the solder joints to large creep strains and leads to early failure of the solder connections. The reliability of such flip chip structures can be enhanced by applying an epoxy-based underfill between the chip and the substrate, encapsulating the solder joints. This material, once cured, mechanically couples the IC and substrate together to locally constrain the CTE mismatch. However, the effects of CTE mismatch are assumed to become more severe with increasing chip size. Even with the addition of an underfill material, it has been supposed that there are limits on the chip size used in flip chip applications
Keywords :
chip-on-board packaging; creep; encapsulation; flip-chip devices; integrated circuit packaging; soldering; thermal expansion; CTE mismatch; DCA; chip size limits; coefficient of thermal expansion; creep strains; epoxy-based underfill; flip chip on board; solder joints; structural compliance; thermal expansion mismatch; underfill material; Capacitive sensors; Circuit testing; Creep; Flip chip; Integrated circuit interconnections; Lead; Silicon; Soldering; Thermal expansion; Wiring;
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
DOI :
10.1109/6104.816091