DocumentCode
128844
Title
Organic thin-film transistor compact model with accurate charge carrier mobility
Author
Maiti, T.K. ; Hayashi, Teruaki ; Chen, Luo-nan ; Miura-Mattausch, M. ; Mattausch, Hans Jurgen
Author_Institution
HiSIM Res. Center, Hiroshima Univ., Higashi-Hiroshima, Japan
fYear
2014
fDate
9-11 Sept. 2014
Firstpage
133
Lastpage
136
Abstract
A physical compact charge carrier mobility model for undoped-body organic thin-film transistors (OTFTs) based on an analysis of the bias-dependent Fermi-energy movement in the band gap is reported. Mobility in localized- and extended-energy states predicts the current transport in week- and strong-inversion regimes, respectively. A hopping mobility model as a function of surface potential is developed to describe the carrier transport through localized trap states located in the band gap. The Poole-Frenkel field effect mechanism is considered to interpret the band-like carrier transport mechanism in extended energy states. Modeled results are compared with the measured DNTT-based high-performance OTFTs data to verify the model.
Keywords
Fermi level; Poole-Frenkel effect; carrier mobility; energy gap; organic field effect transistors; semiconductor device models; thin film transistors; Poole-Frenkel field effect mechanism; band gap; bias-dependent Fermi-energy movement; current transport; extended energy states; hopping mobility model; localized energy states; physical compact charge carrier mobility model; strong inversion regimes; surface potential; undoped-body organic thin-film transistors; weak inversion regime; Integrated circuit modeling; Mathematical model; Organic semiconductors; Organic thin film transistors; Photonic band gap; Semiconductor device modeling; Band Gap; Extended Energy States; Hopping Mobility; Localized Energy States; Poole-Frenkel Effect; Trap;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on
Conference_Location
Yokohama
ISSN
1946-1569
Print_ISBN
978-1-4799-5287-8
Type
conf
DOI
10.1109/SISPAD.2014.6931581
Filename
6931581
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