DocumentCode :
1288445
Title :
Characterization of underfill/substrate interfacial toughness enhancement by silane additives
Author :
Yao, Qizhou ; Qu, Jianmin ; Wu, Jiali ; Wong, C.P.
Author_Institution :
Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
22
Issue :
4
fYear :
1999
fDate :
10/1/1999 12:00:00 AM
Firstpage :
264
Lastpage :
267
Abstract :
This work experimentally measures the apparent fracture toughness of the interfaces between epoxy-based underfill materials and various substrates including aluminum, polyimide, BCB, and printed wiring boards (FR-4) with solder mask. A small amount of silane coupling agent is added to the base underfill in order to form various underfill derivatives, and double layer specimens with preexisting interfacial cracks are prepared for four-point bending tests. The measurements are qualitatively correlated to each silane additive. The purpose of adding silane additives was to enhance the adhesion; the enhancement of interfacial toughness was found to strongly depend on the type of substrate. The results of this study have important implications in flip-chip reliability where interfacial cracking is one of the major failure modes
Keywords :
adhesion; bending; cracks; encapsulation; failure analysis; flip-chip devices; fracture toughness testing; integrated circuit packaging; integrated circuit reliability; soldering; adhesion; apparent fracture toughness; double layer specimens; failure modes; flip-chip reliability; four-point bending tests; interfacial cracking; preexisting interfacial cracks; printed wiring boards; silane additives; silane coupling agent; solder mask; underfill derivatives; underfill/substrate interfacial toughness; Additives; Adhesives; Chemicals; Fatigue; Lead; Packaging; Pollution measurement; Stress; Testing; Thermomechanical processes;
fLanguage :
English
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-334X
Type :
jour
DOI :
10.1109/6104.816092
Filename :
816092
Link To Document :
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