Title :
Study on the relationship between the surface composition of copper pads and no-flow underfill fluxing capability
Author :
Shi, Songhua ; Lu, Daoqiang ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
10/1/1999 12:00:00 AM
Abstract :
The purpose of this paper is to investigate the effect of copper pad surface composition on the wetting of solder bumps during reflow process for a certain no-flow underfill material. A purchased copper foil which is laminated on FR4 board is used as a control surface. Six different procedures are followed to prepare the surface of the copper foil with six different compositions. XPS is then used to analyze the surface compositions of the six surfaces and the control surface. An in-house developed G25 no-flow underfill encapsulant is used to examine the wetting status of eutectic solder balls on these copper surfaces. The correlation of the copper surface compositions with the solder wetting is then established. It is verified that the compositions of the copper foil surfaces strongly depend on the cleaning procedures. For G25 no-flow underfill material, copper oxide (CuO) is the main composition that prevents the solder ball from wetting the copper foils while the observed organic contamination does not have noticeable effect on the solder wetting
Keywords :
X-ray photoelectron spectra; copper; encapsulation; flip-chip devices; reflow soldering; surface cleaning; Cu; XPS; cleaning procedures; control surface; encapsulant; flip-chip devices; no-flow underfill fluxing capability; observed organic contamination; pad surface composition; reflow process; solder bumps; wetting; Atherosclerosis; Cleaning; Composite materials; Copper; Materials science and technology; Organic materials; Packaging; Standards development; Surface contamination; Surface-mount technology;
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
DOI :
10.1109/6104.816093