Cross-correlation noise measurements in A/D converters

Author

Chiorboli, Giovanni ; Fontanili, Massimo

Author_Institution

Dipt. di Ingegneria dell´´Inf., Parma Univ., Italy

Volume

48

Issue

6

fYear

1999

fDate

12/1/1999 12:00:00 AM

Firstpage

1282

Lastpage

1286

Abstract

This paper describes a new technique which allows measuring time-varying noise of (analog-to-digital) A/D converters more accurately than may be possible with traditional test equipment. A previous work demonstrated that the effects of the quantization and nonlinearities on the jitter measurement may be overcome by measuring the noise distribution function. This paper presents a dual-channel technique based on the measurement of the distribution function of the cross-correlated noise between the two channels. The technique is still independent of quantization and nonlinearities. Moreover, it allows separating the noise contribution of the test setup from the converter noise

Keywords

analogue-digital conversion; circuit noise; electric noise measurement; timing jitter; analog-to-digital converter; aperture uncertainty; cross-correlation noise measurement; dual-channel technique; nonlinearity; quantization; time-varying noise distribution function; timing jitter; Analog-digital conversion; Apertures; Distribution functions; Manufacturing; Noise measurement; Performance evaluation; Phase noise; Quantization; Synthesizers; Testing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.816149

Filename

816149