Abstract :
Summary form only given, as follows. We welcome contributions for future installments of the Meas urements Corner. Please send them to Brian Fischer and Ivan LaHaie, and they will be considered for publication as quickly as possible. Contributions can range from short notes to full-length papers on all topics related to RF measurement technology and its applications, including antennas, propaga tion, materials, scattering, and radar cross section. New or unique measurement techniques are of particular interest.