Extended Probe Instrument Calibration (EPIC) for Accurate Spherical Near-Field Antenna Measurements

A probe calibration technique is described that removes artifacts from spherical near-field antenna measurements. The technique is based on preliminary calibration measurements of a known antenna, a process that characterizes the probe and any stationary objects in the measurement chamber including the walls in terms of a set of correction coefficients. These coefficients are then used in a correction algorithm that recovers the correct antenna pattern from the corrupted measurement data.