Title :
A 6-GHz Built-in Jitter Measurement Circuit Using Multiphase Sampler
Author :
Cheng, Kuo-Hsing ; Liu, Jen-Chieh ; Huang, Hong-Yi ; Li, Yu-Liang ; Jhu, Yong-Jhen
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
Abstract :
This brief presents a 6-GHz built-in jitter measurement (BIJM) with the time amplifier (TA) and the multiphase sampler (MPS) to achieve a 1-ps timing resolution. The proposed MPS can reduce the area, and the TA can extend the total timing resolution of BIJM. The self-referenced circuit with the autocalibration technique can eliminate the process variations and create a reference clock being a sampled signal. Using the calibration technique, the gain variation of TA and the timing resolution variation of MPS can be aligned to achieve a 1-ps timing resolution. The sense amplifier delay flip-flop uses the bulk input to reduce the measured error. The BIJM is fabricated by a 90-nm CMOS process. The core area of BIJM is 130 μm × 200 μm, and the power consumption is 20.4 mW with the I/O buffers.
Keywords :
CMOS integrated circuits; flip-flops; jitter; CMOS process; autocalibration; built-in jitter measurement circuit; frequency 6 GHz; multiphase sampler; power 20.4 mW; self-referenced circuit; sense amplifier delay flip-flop; size 90 nm; time amplifier; timing resolution variation; total timing resolution; Calibration; Clocks; Jitter; Latches; Measurement uncertainty; Signal resolution; Timing; Built-in jitter measurement (BIJM); calibration; measured error; multiphase oscillator (MPO); multiphase sampler (MPS); time amplifier (TA);
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2011.2158753