• DocumentCode
    128942
  • Title

    Channel-size dependent dopant placement in silicon nanowires

  • Author

    Hoon Ryu ; Jongseob Kim ; Ki-Ha Hong

  • Author_Institution
    Korea Inst. of Sci. & Technol. Inf., Daejeon, South Korea
  • fYear
    2014
  • fDate
    9-11 Sept. 2014
  • Firstpage
    325
  • Lastpage
    328
  • Abstract
    Sensitivity of Phosphorus dopant placement to the channel size of highly doped silicon nanowires is studied using a 10-band sp3 d5 s* tight-binding approach coupled to self-consistent simulations. Extending the simulation scope to realistically sized nanowires, we observed that uniform doping does not necessarily reduce the channel energy compared to surface-oriented doping when the diameter of a nanowire cross-section is smaller than 20 nm, whilst uniform doping lowers the energy, making the channel more stable at larger cross-sections. This size-dependency, firmly connected to the recent experiment, is understood well in detail by investigating channel electrostatics.
  • Keywords
    SCF calculations; band structure; doping profiles; elemental semiconductors; nanowires; phosphorus; semiconductor doping; silicon; tight-binding calculations; Si:P; channel energy; channel size dependent dopant placement; electronic band structure; highly doped silicon nanowires; self-consistent simulation; sensitivity; surface-oriented doping; tight-binding approach; Doping; Electric potential; Nanowires; Potential energy; Quantum dots; Semiconductor process modeling; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on
  • Conference_Location
    Yokohama
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-4799-5287-8
  • Type

    conf

  • DOI
    10.1109/SISPAD.2014.6931629
  • Filename
    6931629