DocumentCode
128942
Title
Channel-size dependent dopant placement in silicon nanowires
Author
Hoon Ryu ; Jongseob Kim ; Ki-Ha Hong
Author_Institution
Korea Inst. of Sci. & Technol. Inf., Daejeon, South Korea
fYear
2014
fDate
9-11 Sept. 2014
Firstpage
325
Lastpage
328
Abstract
Sensitivity of Phosphorus dopant placement to the channel size of highly doped silicon nanowires is studied using a 10-band sp3 d5 s* tight-binding approach coupled to self-consistent simulations. Extending the simulation scope to realistically sized nanowires, we observed that uniform doping does not necessarily reduce the channel energy compared to surface-oriented doping when the diameter of a nanowire cross-section is smaller than 20 nm, whilst uniform doping lowers the energy, making the channel more stable at larger cross-sections. This size-dependency, firmly connected to the recent experiment, is understood well in detail by investigating channel electrostatics.
Keywords
SCF calculations; band structure; doping profiles; elemental semiconductors; nanowires; phosphorus; semiconductor doping; silicon; tight-binding calculations; Si:P; channel energy; channel size dependent dopant placement; electronic band structure; highly doped silicon nanowires; self-consistent simulation; sensitivity; surface-oriented doping; tight-binding approach; Doping; Electric potential; Nanowires; Potential energy; Quantum dots; Semiconductor process modeling; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on
Conference_Location
Yokohama
ISSN
1946-1569
Print_ISBN
978-1-4799-5287-8
Type
conf
DOI
10.1109/SISPAD.2014.6931629
Filename
6931629
Link To Document