• DocumentCode
    128943
  • Title

    Partial-SET: Write speedup of PCM main memory

  • Author

    Bing Li ; ShuChang Shan ; Yu Hu ; Xiaowei Li

  • Author_Institution
    Key Lab. of Comput. Syst. & Archit., Inst. of Comput. Technol., Beijing, China
  • fYear
    2014
  • fDate
    24-28 March 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Phase change memory (PCM) is a promising nonvolatile memory technology developed as a possible DRAM replacement. Although it offers the read latency close to that of DRAM, PCM generally suffers from the long write latency. Long write request may block the read requests on the critical path of cache/memory access, incurring adverse impact on the system performance. Besides, the write performance of PCM is very asymmetric, i.e, the SET operation (writing `1´) is much slower than that of the RESET operation (writing `0´). In this work, we re-examine the resistance transform process during the SET operation of PCM and propose a novel Partial-SET scheme to alleviate the long write latency issue of PCM. During a write access to a memory line, a short Partial-SET pulse is applied first to program the PCM cells to a pre-stable state, achieving the same write latency as RESET. The partially-SET cells are then fully programmed within the retention window to preserve the data integrity. Experimental results show that our Partial-SET scheme can improve the memory access performance of PCM by more than 45% averagely with very marginal storage overhead.
  • Keywords
    cache storage; phase change memories; DRAM replacement; PCM main memory; RESET operation; SET operation; adverse impact; cache-memory access; data integrity; marginal storage overhead; memory line; nonvolatile memory technology; partial-SET scheme; partially-SET cells; phase change memory; read latency; read request; resistance transform process; retention window; short-partial-SET pulse; write access; write latency; write performance; write request; write speedup; Acceleration; Memory management; Phase change materials; Phase change memory; Random access memory; Reliability; Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.7873/DATE.2014.066
  • Filename
    6800267