DocumentCode
1289433
Title
Thermal-Piezoresistive Energy Pumps in Micromechanical Resonant Structures
Author
Rahafrooz, Amir ; Pourkamali, Siavash
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Denver, Denver, CO, USA
Volume
59
Issue
12
fYear
2012
Firstpage
3587
Lastpage
3593
Abstract
The internal thermoelectromechanical transduction loop in micromechanical resonant structures has been studied in this work and utilized to electronically enhance their quality factor or generate spontaneous mechanical vibrations. Electrothermal force generation in a micromechanical structure can be coupled to the structural stress through piezoresistive effect. Under certain conditions (specially having a negative piezoresistive coefficient in n-type crystalline silicon), this could allow mechanical vibrations of the structure to feed from a dc bias current applied to the structure, forming an electromechanical energy pump. At lower dc bias currents, the mechanical energy generated by the pump can only compensate a portion of the mechanical losses of the resonant structure, leading to self-Q-enhancement, whereas at higher currents, it can fully compensate all the mechanical losses, leading to self-sustained oscillation. Extensional-mode dual-plate resonators with frequencies as high as 18.1 MHz were fabricated, and quality factor amplification was successfully demonstrated for such. The ability of such resonators to initiate and maintain self-sustained oscillations under both vacuum and atmospheric pressures has also been demonstrated. Frequencies as high as 19.4 MHz, output voltage peak-to-peak amplitudes as high as 825 mV, and power consumptions as low as a few milliwatts have been demonstrated for such self-sustained oscillators.
Keywords
Q-factor; electromechanical actuators; elemental semiconductors; micromechanical resonators; oscillators; piezoresistance; pumps; silicon; vibrations; Si; atmospheric pressure; dc bias current; electromechanical energy pump; electrothermal force generation; extensional-mode dual-plate resonators; internal thermoelectromechanical transduction loop; mechanical losses; micromechanical resonant structures; n-type crystalline silicon; piezoresistive effect; quality factor; self-Q-enhancement; self-sustained oscillators; spontaneous mechanical vibrations; structural stress; thermal-piezoresistive energy pumps; vacuum pressure; Actuators; Heating; Oscillators; Piezoresistance; Q factor; Resonant frequency; Active resonator; MEMS resonator; electromechanical energy pump; microelectromechanical systems (MEMS) oscillator; piezoresistive readout; quality factor enhancement; self-oscillation; thermal actuation;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2012.2215863
Filename
6310045
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