DocumentCode :
129046
Title :
Efficient high-sigma yield analysis for high dimensional problems
Author :
Moning Zhang ; Zuochang Ye ; Yan Wang
Author_Institution :
Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
6
Abstract :
High-sigma analysis is important for estimating the probability of rare events. Traditional high-sigma analysis can only work for small-size (low-dimension) problems limiting to 10 ~ 20 random variables, mostly due to the difficulty of finding optimal boundary points. In this paper we propose an efficient method to deal with high-dimension problems. The proposed method is based on performing optimization in a series of low dimension parameter spaces. The final solution can be regarded as a greedy version of the global optimization. Experiments show that the proposed method can efficiently work with problems with > 100 independent variables.
Keywords :
integrated circuit yield; optimisation; probability; random functions; global optimization; high dimensional problems; high-sigma yield analysis; low-dimension problems; optimal boundary points; probability; random variables; rare events; Accuracy; Integrated circuit modeling; Monte Carlo methods; SPICE; SRAM cells; Standards; Vectors; High-sigma; high dimension; importance sampling; yield analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.120
Filename :
6800321
Link To Document :
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