Title :
In-circuit test techniques cut programming requirements
Author :
Apfelbaum, Larry ; Hotchkiss, Jeff
Author_Institution :
Teradyne Inc., Boston, USA
fDate :
10/1/1979 12:00:00 AM
Abstract :
Screening printed-circuit cards for assembly and component defects simplifies the entire testing programme.
Journal_Title :
Electronics and Power
DOI :
10.1049/ep.1979.0413
