• DocumentCode
    1290641
  • Title

    High-Performance Integrated Dual-Gate AlGaN/GaN Enhancement-Mode Transistor

  • Author

    Lu, Bin ; Saadat, Omair Irfan ; Palacios, Tomás

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • Volume
    31
  • Issue
    9
  • fYear
    2010
  • Firstpage
    990
  • Lastpage
    992
  • Abstract
    In this letter, we present a new AlGaN/GaN enhancement-mode (E-mode) transistor based on a dual-gate structure. The dual gate allows the transistor to combine an E-mode behavior with low on-resistance and very high breakdown voltage. The device utilizes an integrated gate structure with a short gate controlling the threshold voltage and a long gate supporting the high-voltage drop from the drain. Using this new dual-gate technology, AlGaN/GaN E-mode transistors grown on a Si substrate have demonstrated a high threshold voltage of 2.9 V with a maximum drain current of 434 mA/mm and a specific on-resistance of 4.3 m Ω·cm2 at a breakdown voltage of 643 V.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; power electronics; wide band gap semiconductors; AlGaN-GaN; E-mode behavior; Si; breakdown voltage; dual-gate structure technology; high-electron-mobility transistor; high-performance integrated dual-gate enhancement-mode transistor; low on-resistance; power electronics; short gate control; threshold voltage; voltage 2.9 V; voltage 643 V; Aluminum gallium nitride; Circuit topology; Gallium nitride; HEMTs; Logic gates; MODFETs; MOSFETs; Power electronics; Power engineering and energy; Reliability engineering; Threshold voltage; AlGaN/GaN; dual-gate; enhancement-mode (E-mode); high-electron-mobility transistor (HEMT); power electronics;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2010.2055825
  • Filename
    5545351