DocumentCode :
129067
Title :
Design of 3D nanomagnetic logic circuits: A full-adder case study
Author :
Perricone, R. ; Hu, Xiaobo Sharon ; Nahas, Joseph ; Niemier, Michael
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of Notre Dame, Notre Dame, IN, USA
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
6
Abstract :
Nanomagnetic logic (NML) is a “beyond-CMOS” technology that combines logic and memory capabilities through field-coupled interactions between nanoscale magnets. NML is intrinsically non-volatile, low-power, and radiation-hard when compared to CMOS equivalents. Moreover, there have been numerous demonstrations of NML circuit functionality within the last decade. These fabricated structures typically employ devices with in-plane magnetization to move and process data. However, in-plane layouts imply circuits and interconnects in only two dimensions (2D), which makes signal routing - and hence circuits - more complex. In this paper, we introduce NML circuits that move and process data in three dimensions (3D). We employ devices with perpendicular magnetic anisotropy (PMA) (i.e., out-of-plane magnetization states) and discuss their behavior when utilized in 3D designs. Furthermore, we provide a systematic design approach for 3D NML circuits using a threshold full adder as a case study. We compare our 3D adder to 2D adders to highlight the benefits of 3D NML circuits, which include simpler signal routing and a smaller area footprint.
Keywords :
adders; magnetic logic; magnetisation; nanoelectronics; nanomagnetics; perpendicular magnetic anisotropy; 2D adders; 3D NML circuits; 3D adder; 3D designs; 3D nanomagnetic logic circuits; NML circuit functionality; beyond-CMOS technology; field-coupled interactions; in-plane magnetization; nanoscale magnets; out-of-plane magnetization states; perpendicular magnetic anisotropy; signal routing; threshold full adder; Magnetic domain walls; Magnetic domains; Magnetic hysteresis; Magnetic switching; Perpendicular magnetic anisotropy; Saturation magnetization; Three-dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.132
Filename :
6800333
Link To Document :
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