Title :
Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits
Author :
Ting Zhu ; Steer, Michael B. ; Franzon, Paul D.
Author_Institution :
Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
Abstract :
Analog circuits designed in submicrometer nodes suffer from process variations, typically requiring calibration in order to center their performance parameters and to recover yield loss. This article presents a design flow to find appropriate tuning knob settings to compensate for different process variation scenarios.
Keywords :
analogue integrated circuits; calibration; circuit optimisation; low noise amplifiers; phase locked loops; radiofrequency integrated circuits; analog RF circuits; design flow; design optimisation; knob settings; performance parameters; process variations; surrogate model based self-calibrated design; temperature compensation; yield loss; Adaptation models; Calibration; Integrated circuit modeling; Integrated circuits; Mathematical model; Noise measurement; Radio frequency; Voltage control; RF; analog; design aids; integrated circuit; optimization; process-voltage-temperature variation; self-calibration; surrogate modeling; yield;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2012.2220332
