DocumentCode :
129089
Title :
Test and non-test cubes for diagnostic test generation based on merging of test cubes
Author :
Pomeranz, Irith
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
4
Abstract :
Test generation by merging of test cubes supports test compaction and test data compression. This paper describes a new approach to the use of test cube merging for the generation of compact diagnostic test sets. For this the paper uses the new concept of non-test cubes. While a test cube for a fault fi0 detects the fault, a non-test cube for a fault fi1 prevents the fault from being detected. Merging a test cube for a fault fi0 and a non-test cube for a fault fi1 produces a diagnostic test cube that distinguishes the two faults. The paper describes a procedure for diagnostic test generation based on merging of test and non-test cubes. Experimental results demonstrate that compact diagnostic test sets are obtained.
Keywords :
automatic test pattern generation; fault diagnosis; compact diagnostic test set; diagnostic test generation; fault diagnosis; nontest cubes; Circuit faults; Educational institutions; Fault detection; Fault diagnosis; Merging; Test data compression; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.143
Filename :
6800344
Link To Document :
بازگشت