DocumentCode
1291067
Title
A Practical Approach to Model Selection for Support Vector Machines With a Gaussian Kernel
Author
Varewyck, Matthias ; Martens, Jean-Pierre
Author_Institution
Electron. & Inf. Syst. Dept., Ghent Univ., Ghent, Belgium
Volume
41
Issue
2
fYear
2011
fDate
4/1/2011 12:00:00 AM
Firstpage
330
Lastpage
340
Abstract
When learning a support vector machine (SVM) from a set of labeled development patterns, the ultimate goal is to get a classifier attaining a low error rate on new patterns. This so-called generalization ability obviously depends on the choices of the learning parameters that control the learning process. Model selection is the method for identifying appropriate values for these parameters. In this paper, a novel model selection method for SVMs with a Gaussian kernel is proposed. Its aim is to find suitable values for the kernel parameter γ and the cost parameter C with a minimum amount of central processing unit time. The determination of the kernel parameter is based on the argument that, for most patterns, the decision function of the SVM should consist of a sufficiently large number of significant contributions. A unique property of the proposed method is that it retrieves the kernel parameter as a simple analytical function of the dimensionality of the feature space and the dispersion of the classes in that space. An experimental evaluation on a test bed of 17 classification problems has shown that the new method favorably competes with two recently published methods: the classification of new patterns is equally good, but the computational effort to identify the learning parameters is substantially lower.
Keywords
Gaussian processes; generalisation (artificial intelligence); pattern classification; support vector machines; Gaussian kernel; central processing unit time; cost parameter; generalization ability; kernel parameter; labeled development patterns; learning process; model selection method; support vector machine; Central Processing Unit; Costs; Error analysis; Kernel; Machine learning; Pattern classification; Process control; Support vector machine classification; Support vector machines; Testing; Data mining; model selection; pattern classification; support vector machine (SVM); Algorithms; Artificial Intelligence; Computer Simulation; Decision Support Techniques; Models, Statistical; Models, Theoretical; Normal Distribution; Pattern Recognition, Automated;
fLanguage
English
Journal_Title
Systems, Man, and Cybernetics, Part B: Cybernetics, IEEE Transactions on
Publisher
ieee
ISSN
1083-4419
Type
jour
DOI
10.1109/TSMCB.2010.2053026
Filename
5545419
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