DocumentCode :
1291165
Title :
A durable gigawatt class solid state pulsed power system
Author :
Hegeler, Frank ; McGeoch, Malcolm W. ; Sethian, John D. ; Sanders, Howard D. ; Glidden, Steven C. ; Myers, Matthew C.
Author_Institution :
Commonwealth Technol., Alexandria, VA, USA
Volume :
18
Issue :
4
fYear :
2011
fDate :
8/1/2011 12:00:00 AM
Firstpage :
1205
Lastpage :
1213
Abstract :
A unique all solid-state pulsed power system has been tested at the Naval Research Laboratory that produced 200 kV, 4.5 kA, and 300 ns pulses, continuously for more than 11,500,000 shots into a resistive load at a repetition rate of 10 pps. The Marx has an efficiency of 80% based on calorimetric measurements. This pulser is used to evaluate components and advance solid state designs for a next generation solid-state pulsed power system to drive an electron beam pumped KrF laser system for inertial fusion energy. The solid state pulser, designed and constructed by PLEX LLC, consists of a 12 stage Marx, coupled with a 3rd harmonic stage to sharpen the Marx output waveforms, a main magnetic switch, a compact pulse forming line used as a transit time isolator, and a resistive load. Each Marx stage uses an APP Model S33A compact high voltage switch that consists of 12 series connected thyristors. A life test on individual thyristors showed operation of >; 300 M shots at 20 Hz without failure.
Keywords :
calorimetry; power systems; pulse generators; pulsed power supplies; thyristors; APP model S33A compact high voltage switch; Marx output waveforms; Naval Research Laboratory; PLEX LLC; calorimetric measurements; compact pulse forming; current 4.6 kA; durable gigawatt class solid state pulsed power system; electron beam pumped laser system; magnetic switch; next generation solid-state pulsed power system; series connected thyristors; time 300 ns; voltage 200 kV; Amorphous magnetic materials; Optical switches; Power systems; Saturation magnetization; Solids; Voltage measurement; Marx generators; Thyristors; magnetic switches; pulse power system; reliability testing;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2011.5976117
Filename :
5976117
Link To Document :
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