Title :
Extraction of multiple coupled line parameters using FDTD simulation
Author :
Kim, Y. ; Tripathi, A. ; Settaluri, R.K. ; Weisshaar, A. ; Tripathi, V.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
fDate :
12/1/1999 12:00:00 AM
Abstract :
A general characterisation procedure based on the extraction of a 2n-port admittance matrix corresponding to n uniform coupled lines using the finite difference time domain (FDTD) technique is presented. The frequency-dependent normal mode parameters are obtained from the 2n-port admittance matrix, which in turn provide the frequency-dependent distributed inductance and capacitance matrices. To illustrate the technique, several practical coupled line structures, including a three-line structure, have been simulated. It is shown that the FDTD-based time domain characterisation procedure is an excellent broadband simulation tool for modelling and characterisation of multiconductor coupled transmission lines
Keywords :
capacitance; coupled transmission lines; digital simulation; electric admittance; equivalent circuits; finite difference time-domain analysis; inductance; multiconductor transmission lines; multiport networks; network parameters; transmission line matrix methods; FDTD simulation; admittance matrix; broadband simulation tool; equivalent circuit parameter extraction; finite difference time domain; frequency-dependent distributed capacitance matrix; frequency-dependent distributed inductance matrix; frequency-dependent normal mode parameters; multiconductor coupled transmission lines; multiple coupled line parameters; three-line structure; time domain characterisation procedure; uniform coupled lines;
Journal_Title :
Microwaves, Antennas and Propagation, IEE Proceedings
DOI :
10.1049/ip-map:19990717
