DocumentCode :
1291626
Title :
A developmental approach to reliability in missile system equipment
Author :
Yueh, John H.
Author_Institution :
Lockheed Aircraft Corporation Missile Systems Division Van Nuys, California
fYear :
1956
Firstpage :
44
Lastpage :
54
Abstract :
Some concepts of reliability based on failure rates of components are presented. These concepts are further interpreted from a statistical point of view for better understanding of the basic reasons for component failures — hence unit, subsystem and system failures. Based on these concepts a program of testing, data collection and analysis is outlined as an approach to estimating and controlling these failure rates to a sufficiently low level so that system reliability is consistent with design objectives.
fLanguage :
English
Journal_Title :
Reliability and Quality Control, IRE Transactions on
Publisher :
ieee
ISSN :
0097-4552
Type :
jour
DOI :
10.1109/IRE-PGRQC.1956.6540349
Filename :
6540349
Link To Document :
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