DocumentCode
1291626
Title
A developmental approach to reliability in missile system equipment
Author
Yueh, John H.
Author_Institution
Lockheed Aircraft Corporation Missile Systems Division Van Nuys, California
fYear
1956
Firstpage
44
Lastpage
54
Abstract
Some concepts of reliability based on failure rates of components are presented. These concepts are further interpreted from a statistical point of view for better understanding of the basic reasons for component failures — hence unit, subsystem and system failures. Based on these concepts a program of testing, data collection and analysis is outlined as an approach to estimating and controlling these failure rates to a sufficiently low level so that system reliability is consistent with design objectives.
fLanguage
English
Journal_Title
Reliability and Quality Control, IRE Transactions on
Publisher
ieee
ISSN
0097-4552
Type
jour
DOI
10.1109/IRE-PGRQC.1956.6540349
Filename
6540349
Link To Document