• DocumentCode
    1291626
  • Title

    A developmental approach to reliability in missile system equipment

  • Author

    Yueh, John H.

  • Author_Institution
    Lockheed Aircraft Corporation Missile Systems Division Van Nuys, California
  • fYear
    1956
  • Firstpage
    44
  • Lastpage
    54
  • Abstract
    Some concepts of reliability based on failure rates of components are presented. These concepts are further interpreted from a statistical point of view for better understanding of the basic reasons for component failures — hence unit, subsystem and system failures. Based on these concepts a program of testing, data collection and analysis is outlined as an approach to estimating and controlling these failure rates to a sufficiently low level so that system reliability is consistent with design objectives.
  • fLanguage
    English
  • Journal_Title
    Reliability and Quality Control, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0097-4552
  • Type

    jour

  • DOI
    10.1109/IRE-PGRQC.1956.6540349
  • Filename
    6540349