Title :
Open-loop chaotic synchronization of injection-locked semiconductor lasers with gigahertz range modulation
Author :
Chen, H.F. ; Liu, J.M.
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
Unidirectional chaotic synchronization between two remote injection-locked semiconductor lasers to achieve chaotic communications is investigated numerically. Different from the direct chaotic masking methods, the chaotic carrier wave is generated from different chaotic states in transience instead of a fixed chaotic state in static to prevent it from being reproduced through a reconstructed embedding phase space. The testing digital and sinusoidal message signals in the gigahertz range can be easily recovered without the use of any electronic or optical filter to filter out the synchronization error. The robustness of synchronization is examined by using the intrinsic white noise of the transmitter and the receiver as the perturbation. The effects of parameter mismatches on the quality and robustness of synchronization are analyzed in detail. The results show that different internal parameters have very different tolerances for parameter mismatch. A short discussion on the phase sensitivity of synchronization is also given.
Keywords :
laser mode locking; optical chaos; optical modulation; optical receivers; optical transmitters; semiconductor lasers; synchronisation; white noise; chaotic carrier wave; chaotic communications; chaotic states; direct chaotic masking methods; gigahertz range modulation; injection-locked semiconductor lasers; internal parameters; intrinsic white noise; open-loop chaotic synchronization; parameter mismatches; perturbation; phase sensitivity; quality; receiver; reconstructed embedding phase space; remote injection-locked semiconductor lasers; robustness; sinusoidal message signals; synchronization error; testing digital signals; transience; transmitter; unidirectional chaotic synchronization; Chaos; Chaotic communication; Digital filters; Electronic equipment testing; Noise robustness; Optical filters; Optical receivers; Optical transmitters; Semiconductor lasers; White noise;
Journal_Title :
Quantum Electronics, IEEE Journal of