First-order sensitivity analysis of quartz crystal resonator model parameters

Author

Malocha, Donald C. ; Belkerdid, Madjid A.

Author_Institution

Dept. of Electr. Eng., Univ. of Central Florida, Orlando, FL, USA

Volume

37

Issue

6

fYear

1990

Firstpage

602

Lastpage

603

Abstract

A first-order measurement sensitivity analysis of a single mode, quartz resonator device model was conducted. This analysis predicts the variations in the motional arm resistance versus the resonance S-parameter as a function of measurement errors. The accuracy of this first-order sensitivity analysis is verified by computer simulation and experimentally. The model parameters were extracted following the recommended EIA-512 standard. The theoretical first-order sensitivity analysis, the computer simulation results, and the experimental measurements are found to be in good agreement.<>

Keywords

S-parameters; crystal resonators; digital simulation; electronic engineering computing; equivalent circuits; measurement errors; sensitivity analysis; EIA-512 standard; SiO/sub 2/; computer simulation; first-order measurement sensitivity analysis; measurement errors; motional arm resistance; quartz crystal resonator model parameters; resonance S-parameter; single mode quartz resonator device model; Electric resistance; Electric variables measurement; Electrical resistance measurement; Impedance; Measurement errors; Motion analysis; Parasitic capacitance; Resonance; Scattering parameters; Sensitivity analysis;

fLanguage

English

Journal_Title

Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on

Publisher

ieee

ISSN

0885-3010

Type

jour

DOI

10.1109/58.63119

Filename

63119