DocumentCode :
129238
Title :
Analyzing and eliminating the causes of fault sensitivity analysis
Author :
Ghalaty, Nahid Farhady ; Aysu, Aydin ; Schaumont, Patrick
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
6
Abstract :
Fault Sensitivity Analysis (FSA) is a new type of side-channel attack that exploits the relation between the sensitive data and the faulty behavior of a circuit, the so-called fault sensitivity. This paper analyzes the behavior of different implementations of AES S-box architectures against FSA, and proposes a systematic countermeasure against this attack. This paper has two contributions. First, we study the behavior and structure of several S-box implementations, to understand the causes behind the fault sensitivity. We identify two factors: the timing of fault sensitive paths, and the number of logic levels of fault sensitive gates within the netlist. Next, we propose a systematic countermeasure against FSA. The countermeasure masks the effect of these factors by intelligent insertion of delay elements. We evaluate our methodology by means of an FPGA prototype with built-in timing-measurement. We show that FSA can be thwarted at low hardware overhead. Compared to earlier work, our method operates at the logic-level, is systematic, and can be easily generalized to bigger circuits.
Keywords :
cryptography; field programmable gate arrays; logic gates; sensitivity analysis; AES S-box architectures; FPGA prototype; FSA; built-in timing-measurement; delay elements; fault sensitive gates; fault sensitive paths; fault sensitivity analysis; intelligent insertion; logic levels; side-channel attack; systematic countermeasure; Circuit faults; Cryptography; Delays; Hamming weight; Logic gates; Sensitivity; Data Dependency; FPGA; Fault Sensitivity Analysis; On-chip time measurement; S-box;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.217
Filename :
6800418
Link To Document :
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