DocumentCode
1292510
Title
A microprocessor-controlled P.C.M. test set
Author
Pearson, W.R.
Author_Institution
Hewlett-Packard Ltd., Research & Development Department, South Queensferry, UK
Volume
26
Issue
10
fYear
1980
fDate
10/1/1980 12:00:00 AM
Firstpage
816
Lastpage
821
Abstract
With the explosive increase in the manufacture and use of complex digital systems, the need for rapid and effective labour-saving testing equipment has also grown. This article describes the design features and elements of one such family of `intelligent¿ microprocessor-based automatic test sets
fLanguage
English
Journal_Title
Electronics and Power
Publisher
iet
ISSN
0013-5127
Type
jour
DOI
10.1049/ep.1980.0418
Filename
5197991
Link To Document