DocumentCode :
1292774
Title :
Memory testing. characterisation timing and patterns
Author :
Rosenfield, P.
Author_Institution :
Teradyne Inc., Chatsworth, USA
Volume :
25
Issue :
1
fYear :
1979
fDate :
1/1/1979 12:00:00 AM
Firstpage :
26
Lastpage :
31
Abstract :
Semiconductor memory testing is of growing importance to manufacturers of electronic equipment. Memories are being designed into a surprising number of different types of electronic equipment, and so the memory content of end products continues to expand. Also memory complexity, and the complexity of the printed-circuit boards to which they are attached, is increasing. All these factors emphasise the need for memory testing
fLanguage :
English
Journal_Title :
Electronics and Power
Publisher :
iet
ISSN :
0013-5127
Type :
jour
DOI :
10.1049/ep.1979.0034
Filename :
5198047
Link To Document :
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