DocumentCode :
1292920
Title :
Gaussian beam analysis of propagation from an extended plane aperture distribution through dielectric layers. I. Plane layer
Author :
Maciel, John J. ; Felsen, Leopold B.
Author_Institution :
Raytheon Co., Tewksbury, MA, USA
Volume :
38
Issue :
10
fYear :
1990
fDate :
10/1/1990 12:00:00 AM
Firstpage :
1607
Lastpage :
1617
Abstract :
High-frequency propagation of electromagnetic wavefields from an extended planar aperture distribution through a complicated environment is addressed. Geometric optical ray tracing provides a versatile approximate approach to the class of problems, but it fails in transition regions surrounding shadow boundaries and caustics. The uniformity required there can be established by field tracking with Gaussian beams. The basic theory is summarized and applied to the two-dimensional test problem of transmission of radiation from a finite one-dimensional plane aperture through a planar dielectric layer. For a truncated uniform or focused aperture illumination, tracking the edge or caustic transition regions through the layer when it is located within the Fresnel zone of the aperture poses a problem of substantial complexity. It is shown that narrow-waisted beams, which can be propagated in their far zone as complex ray fields, reconstruct the correct transmitted field in these cases, as established independently by numerical evaluation of an exact spectral integral
Keywords :
electromagnetic wave propagation; Fresnel zone; Gaussian beam analysis; HF propagation; caustic transition regions; complex ray fields; electromagnetic propagation; extended planar aperture distribution; far zone; field tracking; finite one-dimensional plane aperture; narrow-waisted beams; planar dielectric layer; Apertures; Dielectrics; Electromagnetic propagation; Electromagnetic scattering; Fresnel reflection; Geometrical optics; Lighting; Optical propagation; Ray tracing; Testing;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/8.59774
Filename :
59774
Link To Document :
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