• DocumentCode
    1293210
  • Title

    Analog ALC crystal oscillators for high-temperature applications

  • Author

    Bianchi, Raül Andrés ; Karam, Jean Michel ; Courtois, Bernard

  • Author_Institution
    TIMA Lab., Grenoble, France
  • Volume
    35
  • Issue
    1
  • fYear
    2000
  • Firstpage
    2
  • Lastpage
    14
  • Abstract
    Fundamental mode and third-harmonic mode integrated high-performance automatic level controlled (ALC) crystal oscillators for high-temperature applications (up to 250/spl deg/C), are described in this paper. These oscillators were designed for a pressure measurement system in high-temperature environments, where the output signal is the difference between both generated frequencies. Frequency variations smaller than 0.0001 ppm/s for each oscillator and a frequency drift of about 2.5 ppm/year of the frequency difference are the measured performance concerning, respectively, the short-term (1 s) and long-term frequency stability of these integrated high performance crystal oscillators over the 30/spl deg/C-225/spl deg/C temperature range. Other important characteristics are the very stable and constant oscillation levels (/spl sim/1.1 Vpp), the small second-harmonic distortion (/spl sim/60 dR), and the phase noise (/spl sim/95 dB at 50 kHz shift). The characteristics of these oscillators make them also suitable for many other measurement systems (time, temperature, and other physical and chemical quantities), especially if they are constrained to operate under severe temperature conditions.
  • Keywords
    crystal oscillators; frequency stability; harmonic distortion; high-temperature electronics; phase noise; 30 to 250 degC; analog ALC crystal oscillators; automatic level control; constant oscillation levels; frequency drift; frequency stability; fundamental mode; high-temperature applications; measurement systems; phase noise; pressure measurement system; second-harmonic distortion; severe temperature conditions; third-harmonic mode; Automatic control; Automatic logic units; Distortion measurement; Frequency measurement; Oscillators; Pressure measurement; Signal design; Signal generators; Stability; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.818915
  • Filename
    818915