A new measurement approach for phase noise at close-in offset frequencies of free-running oscillators

Author

Zhang, Xiangdong ; Rizzi, Brian J. ; Kramer, James

Author_Institution

M/A-COM Inc., Burlington, MA, USA

Volume

44

Issue

12

fYear

1996

fDate

12/1/1996 12:00:00 AM

Firstpage

2711

Lastpage

2717

Abstract

This paper presents a new measurement approach which has been developed as a practical method for quick, accurate and low cost measurements of close-in offset phase noise of microwave free-running oscillators. To overcome the shortcomings of conventional measurement methods, this approach utilizes the injection locking technique to stabilize the free-running oscillator and down-convert the oscillator noise to baseband. Theoretical and experimental studies clearly demonstrate the accuracy, the effectiveness and the flexibility of this measurement technique. The phase noise of voltage controlled oscillators (VCO´s) at 2.5 and 9.3 GHz have been measured to verify the new approach

Keywords

circuit stability; circuit testing; electric noise measurement; microwave measurement; microwave oscillators; phase noise; voltage-controlled oscillators; 2.5 GHz; 9.3 GHz; VCO; close-in offset frequencies; free-running oscillators; injection locking technique; low cost measurements; measurement method; microwave oscillators; oscillator noise downconversion; phase noise; voltage controlled oscillators; Baseband; Costs; Injection-locked oscillators; Microwave measurements; Microwave oscillators; Microwave theory and techniques; Noise measurement; Phase measurement; Phase noise; Voltage-controlled oscillators;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.554656

Filename

554656