DocumentCode
129334
Title
Preparation of (K, Na)NbO3 -CaTiO3 film by RF magnetron sputtering
Author
Ikeuchi, Shinji ; Yoneda, Tomokazu ; Matsuki, Y. ; Endo, N. ; Takeshima, Yutaka ; Horiuchi, Hiroyasu ; Kishimoto, Yutaka ; Yamamoto, Koji ; Fujimoto, Kenji
Author_Institution
Murata Manuf. Co., Ltd., Kyoto, Japan
fYear
2014
fDate
3-6 Sept. 2014
Firstpage
1578
Lastpage
1581
Abstract
Lead-free piezoelectric (K, Na)NbO3-CaTiO3 (KNN-CT) films were prepared on Pt/Ti/SiO2/Si substrates by RF magnetron sputtering. Co-sputtering using a number of KNN-CT targets which vary in compositions of Na/(K+Na) ratio and amount of CaTiO3 provided variations in compositions of KNN-CT films. The obtained KNN-CT films had compositions corresponding to the average compositions of the used targets represented by chemical formula of (1-n)(K1-x, Nax)NbO3-nCaTiO3 (x=0.460-0.617, n=0.000-0.065) and the compositional dependencies of their piezoelectric properties were studied. Most KNN-CT films with n>0.000 exhibited relatively high transverse piezoelectric coefficients |e31 *|=|d31|/s11,p>6.0C/m2 (where s11,p is elastic compliance of the KNN-CT films), whereas n=0.000 |e31 *|<;5.0C/m2. In XRD analysis, (002) peak angle of these pseudocubic perovskite films increased with increase of n. From these results, we conclude that CaTiO3 was successfully substituted as part of KNN and piezoelectric constant increased by effect of CaTiO3. In addition, the KNN-CT films with x=0.587-0.617 and n=0.027-0.053 exhibited higher |e31 *| than any other x and n. Moreover, by 750°C post-annealing process, |e31 *| of the KNN-CT film with x=0.587 and n=0.040 was enhanced and the highest |e31 *|=11.7C/m2 was confirmed. This result of our experiment shows one of highest piezoelectric coefficient for lead free piezoelectric films.
Keywords
annealing; piezoelectric thin films; potassium compounds; sodium compounds; sputtering; (K, Na)NbO3-CaTiO3 film preparation; KNN-CT; KNbO3-CaTiO3; NaNbO3-CaTiO3; Pt-Ti-SiO2-Si; Pt/Ti/SiO2/Si substrates; RF magnetron sputtering; chemical formula; cosputtering; lead-free piezoelectric films; piezoelectric properties; postannealing process; pseudocubic perovskite films; transverse piezoelectric coefficients; Ceramics; Electrodes; Films; Lead; Niobium; Sputtering; Substrates; lead free; piezoelectric film; sputtering;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium (IUS), 2014 IEEE International
Conference_Location
Chicago, IL
Type
conf
DOI
10.1109/ULTSYM.2014.0391
Filename
6931906
Link To Document