DocumentCode :
1293402
Title :
A comparison of experimental results to those in “evaluation of bipolar junction transistor transconductance in practical applications”
Author :
Kim, Ernest M. ; Schubert, Thomas F., Jr.
Author_Institution :
Dept. of Electr. Eng., San Diego State Univ., CA, USA
Volume :
40
Issue :
1
fYear :
1997
fDate :
2/1/1997 12:00:00 AM
Firstpage :
114
Lastpage :
115
Abstract :
An attempt to recreate the experimental results given in the paper by C.D. Ferris (see ibid., vol.36, p.293-5, 1993) was made using a modern transistor curve tracer. The experimental results were not reproduced. The new experimental results seem to validate the common usage of η≈1 in describing bipolar junction transistors
Keywords :
bipolar transistors; electric admittance measurement; bipolar junction transistor; transconductance; transistor curve tracer; Circuit simulation; Computer aided instruction; Computer science education; Educational programs; Logic circuits; Microcomputers; SPICE; Torque; Transconductance; Voltage;
fLanguage :
English
Journal_Title :
Education, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9359
Type :
jour
DOI :
10.1109/13.554677
Filename :
554677
Link To Document :
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