Title :
SiON Integrated Optics Elliptic Couplers for Fizeau-Based Optical Coherence Tomography
Author :
Nguyen, Vinh Dinh ; Ismail, Nur ; Sun, Fei ; Wörhoff, Kerstin ; van Leeuwen, Ton G. ; Kalkman, Jeroen
Author_Institution :
Biomed. Eng. & Phys. Dept., Univ. of Amsterdam, Amsterdam, Netherlands
Abstract :
Integrated optics potentially can offer significant cost reductions and new applications to Optical Coherence Tomography (OCT). We design, fabricate, and characterize Silicon oxynitride (SiON) elliptic couplers, which can be used to focus light from a chip into the off-chip environment. Fizeau-based OCT measurements are performed with elliptic couplers and a moveable mirror. The optical fields at the output of the elliptic coupler are simulated and measured. Good agreement is observed between the measured OCT signal as a function of depth and calculations based on the optical field at the end of the elliptic coupler.
Keywords :
integrated optics; optical couplers; optical fabrication; optical tomography; optical waveguides; silicon compounds; Fizeau-based optical coherence tomography; OCT measurements; SiON; integrated optics elliptic couplers; optical fabrication; optical waveguides; silicon oxynitride; Biomedical optical imaging; Couplers; Integrated optics; Lenses; Optical design; Optical devices; Optical fibers; Optical imaging; Optical interferometry; Optical reflection; Optical refraction; Optical scattering; Optical variables measurement; Tomography; Elliptic couplers; integrated optics; optical coherence tomography;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2010.2066958