Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs

Author

Zjajo, Amir ; Tang, Qin ; Berkelaar, Michel ; De Gyvez, Jose Pineda ; Bucchianico, Alessandro Di ; Van der Meijs, Nick

Author_Institution

Delft Univ. of Technol., Delft, Netherlands

Volume

58

Issue

1

fYear

2011

Firstpage

164

Lastpage

175

Abstract

A time-domain methodology for statistical simulation of nonlinear dynamic integrated circuits with arbitrary excitations is presented. The statistical behavior of the circuits is described as a set of stochastic differential equations rather than estimated by a population of realizations and Gaussian closure approximations are introduced to obtain a closed form of moment equations. Statistical simulation of specific circuits shows that the proposed numerical methods offer accurate and efficient solution of stochastic differentials for variability and noise analysis of integrated circuits.

Keywords

CMOS integrated circuits; differential equations; integrated circuit design; integrated circuit reliability; statistics; stochastic processes; deep-submicrometer CMOS process; integrated circuit noise analysis; moment equations; nonlinear dynamic integrated circuits; reliable circuit designs; statistical simulation; stochastic analysis; stochastic differential equations; time-domain methodology; CMOS process; Circuit simulation; Circuit synthesis; Differential equations; Equations; Integrated circuit modeling; Integrated circuit noise; Integrated circuit reliability; Mathematical model; Noise; Nonlinear equations; Stochastic processes; Stochastic resonance; Time domain analysis; Transistors; Noise analysis; statistical simulation; stochastic differential equations; variability;

fLanguage

English

Journal_Title

Circuits and Systems I: Regular Papers, IEEE Transactions on

Publisher

ieee

ISSN

1549-8328

Type

jour

DOI

10.1109/TCSI.2010.2055291

Filename

5546909