Title :
Single event upset characterization of the Pentium(R) MMX and Pentium(R) II microprocessors using proton irradiation
Author :
Hiemstra, David M. ; Baril, Allan
Author_Institution :
MacDonald Dettwiler Space & Adv. Robotics Ltd., Brampton, Ont., Canada
Abstract :
Experimental single event upset characterization of the Pentium(R) MMX and Pentium(R) II microprocessors using proton irradiation are presented. Results show the Pentium(R) II processor core cross-section is ten times that of the MMX.
Keywords :
microprocessor chips; proton effects; Pentium II; Pentium MMX; cross-section; microprocessor; proton irradiation; single event upset; Application software; Chip scale packaging; Error correction codes; Logic testing; Manufacturing processes; Microcomputers; Microprocessors; Particle beams; Random access memory; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
