• DocumentCode
    1293817
  • Title

    Single event upset characterization of the Pentium(R) MMX and Pentium(R) II microprocessors using proton irradiation

  • Author

    Hiemstra, David M. ; Baril, Allan

  • Author_Institution
    MacDonald Dettwiler Space & Adv. Robotics Ltd., Brampton, Ont., Canada
  • Volume
    46
  • Issue
    6
  • fYear
    1999
  • Firstpage
    1453
  • Lastpage
    1460
  • Abstract
    Experimental single event upset characterization of the Pentium(R) MMX and Pentium(R) II microprocessors using proton irradiation are presented. Results show the Pentium(R) II processor core cross-section is ten times that of the MMX.
  • Keywords
    microprocessor chips; proton effects; Pentium II; Pentium MMX; cross-section; microprocessor; proton irradiation; single event upset; Application software; Chip scale packaging; Error correction codes; Logic testing; Manufacturing processes; Microcomputers; Microprocessors; Particle beams; Random access memory; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.819107
  • Filename
    819107
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1293817