• DocumentCode
    129398
  • Title

    May-happen-in-parallel analysis based on segment graphs for safe ESL models

  • Author

    Weiwei Chen ; Xu Han ; Domer, Rainer

  • Author_Institution
    Center for Embedded Comput. Syst., Univ. of California, Irvine, Irvine, CA, USA
  • fYear
    2014
  • fDate
    24-28 March 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A well-defined system-level model contains explicit parallelism and should be free from parallel access conflicts to shared variables. However, safe parallelism is difficult to achieve since risky shared variables are often hidden deep in the design and are not exposed through simulation. In this paper, we propose a new static analysis approach based on segment graphs that identifies a tight set of potential access conflicts in segments that may-happen-in-parallel (MHP). Our experimental results show that the analysis is complete, accurate and fast to reveal dangerous shared variables in several embedded application models. Compared to earlier work, our approach significantly reduces the number of false conflict reports and thus saves the designer time.
  • Keywords
    embedded systems; graph theory; integrated circuit modelling; program diagnostics; electronic system level; embedded application; explicit parallelism; false conflict reports; may-happen-in-parallel analysis; risky shared variables; safe ESL models; segment graphs; static analysis; system-level model; Algorithm design and analysis; Analytical models; Arrays; Computational modeling; Heuristic algorithms; Parallel processing; Semantics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.7873/DATE.2014.300
  • Filename
    6800501