DocumentCode :
1294131
Title :
An Analytical Model of the Switching Behavior of 4H-SiC p ^{bm +} -n-n ^{bm +} Diodes from Arb
Author :
Bellone, Salvatore ; Corte, Francesco G Della ; Benedetto, Luigi Di ; Licciardo, Gian Domenico
Author_Institution :
DIEII, Univ. degli Studi di Salerno, Salerno, Italy
Volume :
27
Issue :
3
fYear :
2012
fDate :
3/1/2012 12:00:00 AM
Firstpage :
1641
Lastpage :
1652
Abstract :
An analytical model of the switching behavior of SiC diodes is presented. The model gives an accurate description of the current and voltage transient for a wide range of reverse to forward current ratios and allows one to evaluate the spatial-temporal distributions of carriers density, current components and electric field along the base at a generic instant of the whole transient. Using this model, a large-signal circuit is derived that is useful for circuital analysis of diode under generic operation conditions. The accuracy of the model is verified by comparisons with numerical simulations and experimental results.
Keywords :
electric fields; semiconductor diodes; silicon compounds; spatiotemporal phenomena; transients; wide band gap semiconductors; 4H-SiC p+-n-n+ diode; SiC; arbitrary injection condition; carriers density; current component; current transient; electric field; forward current ratio; large-signal circuit; numerical simulation; spatial-temporal distribution; switching behavior; voltage transient; Electric fields; Numerical models; P-i-n diodes; Silicon carbide; Switches; Transient analysis; 4H polytype of silicon carbide (4H-SiC); Diodes; reverse recovery; storage; turn-OFF;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2011.2164097
Filename :
5979159
Link To Document :
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