• DocumentCode
    1294131
  • Title

    An Analytical Model of the Switching Behavior of 4H-SiC p ^{bm +} -n-n ^{bm +} Diodes from Arb

  • Author

    Bellone, Salvatore ; Corte, Francesco G Della ; Benedetto, Luigi Di ; Licciardo, Gian Domenico

  • Author_Institution
    DIEII, Univ. degli Studi di Salerno, Salerno, Italy
  • Volume
    27
  • Issue
    3
  • fYear
    2012
  • fDate
    3/1/2012 12:00:00 AM
  • Firstpage
    1641
  • Lastpage
    1652
  • Abstract
    An analytical model of the switching behavior of SiC diodes is presented. The model gives an accurate description of the current and voltage transient for a wide range of reverse to forward current ratios and allows one to evaluate the spatial-temporal distributions of carriers density, current components and electric field along the base at a generic instant of the whole transient. Using this model, a large-signal circuit is derived that is useful for circuital analysis of diode under generic operation conditions. The accuracy of the model is verified by comparisons with numerical simulations and experimental results.
  • Keywords
    electric fields; semiconductor diodes; silicon compounds; spatiotemporal phenomena; transients; wide band gap semiconductors; 4H-SiC p+-n-n+ diode; SiC; arbitrary injection condition; carriers density; current component; current transient; electric field; forward current ratio; large-signal circuit; numerical simulation; spatial-temporal distribution; switching behavior; voltage transient; Electric fields; Numerical models; P-i-n diodes; Silicon carbide; Switches; Transient analysis; 4H polytype of silicon carbide (4H-SiC); Diodes; reverse recovery; storage; turn-OFF;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2011.2164097
  • Filename
    5979159