• DocumentCode
    1294207
  • Title

    Accelerated Source-Sweep Analysis Using a Reduced-Order Model Approach

  • Author

    Bradley, Patrick ; Brennan, Conor ; Condon, Marissa ; Mullen, Marie

  • Author_Institution
    RF Modelling & Simulation Group, Dublin City Univ., Dublin, Ireland
  • Volume
    59
  • Issue
    11
  • fYear
    2011
  • Firstpage
    4360
  • Lastpage
    4363
  • Abstract
    This communication is concerned with the development of a model-order reduction (MOR) approach for the acceleration of a source-sweep analysis using the volume electric field integral equation (EFIE) formulation. In particular, we address the prohibitive computational burden associated with the repeated solution of the two-dimensional electromagnetic wave scattering problem for source-sweep analysis. The method described within is a variant of the Krylov subspace approach to MOR, that captures at an early stage of the iteration the essential features of the original system. As such these approaches are capable of creating very accurate low-order models. Numerical examples are provided that demonstrate the speed-up achieved by utilizing these MOR approaches when compared against a method of moments (MoM) solution accelerated by use of the fast Fourier transform (FFT).
  • Keywords
    electric field integral equations; electromagnetic wave scattering; fast Fourier transforms; iterative methods; method of moments; reduced order systems; Krylov subspace approach; MOR approach; accelerated source-sweep analysis; computational burden; fast Fourier transform; low order model; method of moment solution; model order reduction approach; reduced order model approach; two dimensional electromagnetic wave scattering problem; volume electric field integral equation; Acceleration; Approximation methods; Equations; Mathematical model; Moment methods; Position measurement; Scattering; Electromagnetic propagation; method of moments; projection algorithms;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2011.2164210
  • Filename
    5979173