• DocumentCode
    1294418
  • Title

    Time-Resolved PLIF Imaging of OH Radicals in the Afterglow of Nanosecond Pulsed Discharge in Combustible Mixtures

  • Author

    Wu, Liang ; Lane, Jamie ; Cernansky, Nicholas ; Miller, David ; Fridman, Alexander ; Starikovskiy, Andrey

  • Author_Institution
    Mech. Eng. & Mech., Drexel Univ., Philadelphia, PA, USA
  • Volume
    39
  • Issue
    11
  • fYear
    2011
  • Firstpage
    2604
  • Lastpage
    2605
  • Abstract
    A time-resolved planar laser-induced fluorescence (PLIF) imaging technique has been used to investigate the spatial distribution of OH radical dynamics in the afterglow of a pulsed nanosecond discharge. Experiments were carried out using a lean methane/air mixture, at temperatures of 300 K and 500 K and at atmospheric pressure. The nanosecond pulsed discharge was formed in a pin-to-pin electrode system. Time-resolved PLIF imaging indicated uniform OH radical dynamics along the discharge channel. Comparison of OH radical emission dynamics with discharge emission dynamics from excited nitrogen revealed a close similarity in spatial distribution and allowed to clarify the mechanisms of atomic oxygen formation.
  • Keywords
    afterglows; air; combustion; gas mixtures; organic compounds; oxygen compounds; plasma chemistry; plasma diagnostics; plasma temperature; OH; OH radical emission dynamics; afterglow analysis; atmospheric pressure; atomic oxygen formation mechanism; combustible mixtures; discharge channel; discharge emission dynamics; lean methane-air mixture; nanosecond pulsed discharge; pin-to-pin electrode system; pressure 1 atm; spatial distribution; temperature 300 K; temperature 500 K; time-resolved planar laser-induced fluorescence imaging technique; uniform OH radical dynamics; Combustion; Discharges; Ignition; Nitrogen; Plasma temperature; Vehicle dynamics; Laser-induced fluorescence; plasma assisted combustion; pulsed nanosecond discharge; self-ignition threshold;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2011.2160739
  • Filename
    5979209