Title :
ArChiVED: Architectural checking via event digests for high performance validation
Author :
Chang-Hong Hsu ; Chatterjee, Debangshu ; Morad, R. ; Ga, Raviv ; Bertacco, Valeria
Author_Institution :
Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
Simulation-based techniques play a key role in validating the functional correctness of microprocessor designs. A common approach for validating microprocessors (called instruction-by-instruction, or IBI checking) consists of running a RTL and an architectural simulation in lock-step, while comparing processor architectural state at each instruction retirement. This solution, however, cannot be deployed on long regression tests, because of the limited performance of RTL simulators. Acceleration platforms have the performance power to overcome this issue, but are not amenable to the deployment of an IBI checking methodology. Indeed, validation on these platforms requires logging activity on-platform and then checking it against a golden model off-platform. Unfortunately, an IBI checking approach following this paradigm entails a large slowdown for the acceleration platform, because of the sizable amount of data that must be transferred off-platform for comparison against the golden model. In this work we propose a sequence-by-sequence (SBS) checking approach that is efficient and practical for acceleration platforms. Our solution validates the test execution over sequences of instructions (instead of individual ones), thus greatly reducing the amount of data transferred for off-platform checking. We found that SBS checking delivers the same bug-detection accuracy as traditional IBI checking, while reducing the amount of traced data by more than 90%.
Keywords :
logic design; microprocessor chips; ArChiVED; IBI checking methodology; RTL simulators; SBS checking approach; acceleration platform; architectural checking via event digests; bug-detection accuracy; golden model off-platform; high performance validation; instruction-by-instruction checking; microprocessor designs; off-platform checking; processor architectural state; sequence-by-sequence checking approach; simulation-based techniques; Acceleration; Accuracy; Computer bugs; Integrated circuit modeling; Registers; Scattering;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
DOI :
10.7873/DATE.2014.330