Title :
A generalized method for de-embedding of multiport networks
Author :
Sharma, P.C. ; Gupta, K.C.
Author_Institution :
Dept. of Electrical Engng., Indian Inst. of Technol., Kanpur, India
Abstract :
The concept of desegmentation proposed earlier for analysis of two-dimensional microwave circuits is used to evolve a generalized method for de-embedding of multiport devices (or networks). The formulation is in terms of S-parameters of the embedded network and those of the embedding network. The proposed technique is illustrated by an example of three-port circuit.
Keywords :
S-parameters; measurement theory; microwave measurement; multiport networks; network analysis; S-parameters; analysis of two-dimensional microwave circuits; de-embedding of multiport devices; desegmentation; embedded network; embedding network; measurement theory; three-port circuit; Connectors; Microwave circuits; Microwave integrated circuits; Microwave measurements; Scattering parameters;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1981.6312418
