• DocumentCode
    1294921
  • Title

    A model for 1/f noise

  • Author

    Bliek, Leendert

  • Author_Institution
    Phys.-Tech. Bundesanstalt, Braunschweig, West Germany
  • Issue
    4
  • fYear
    1981
  • Firstpage
    307
  • Lastpage
    309
  • Abstract
    As in many other fields, 1/f noise plays an important role in precise electromagnetic measurements. Starting from the assumption that noise is generated by fluctuations of a parameter, subject to a diffusion equation, a model is developed which for samples of finite size produces a 1/f spectrum over a wide frequency range.
  • Keywords
    measurement theory; modelling; random noise; 1/f noise; diffusion equation; electromagnetic measurements; measurement theory; model; parameter fluctuation; random noise; Connectors; Fluctuations; Mathematical model; Microwave circuits; Microwave integrated circuits; Noise;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1981.6312419
  • Filename
    6312419