DocumentCode :
1294921
Title :
A model for 1/f noise
Author :
Bliek, Leendert
Author_Institution :
Phys.-Tech. Bundesanstalt, Braunschweig, West Germany
Issue :
4
fYear :
1981
Firstpage :
307
Lastpage :
309
Abstract :
As in many other fields, 1/f noise plays an important role in precise electromagnetic measurements. Starting from the assumption that noise is generated by fluctuations of a parameter, subject to a diffusion equation, a model is developed which for samples of finite size produces a 1/f spectrum over a wide frequency range.
Keywords :
measurement theory; modelling; random noise; 1/f noise; diffusion equation; electromagnetic measurements; measurement theory; model; parameter fluctuation; random noise; Connectors; Fluctuations; Mathematical model; Microwave circuits; Microwave integrated circuits; Noise;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1981.6312419
Filename :
6312419
Link To Document :
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