Title :
GPGPUs: How to combine high computational power with high reliability
Author :
Bautista Gomez, L. ; Cappello, Franck ; Carro, Luigi ; DeBardeleben, Nathan ; Fang, B. ; Gurumurthi, Sudhanva ; Pattabiraman, Karthik ; Rech, P. ; Sonza Reorda, M.
Author_Institution :
Argonne Nat. Lab., Argonne, IL, USA
Abstract :
GPGPUs are used increasingly in several domains, from gaming to different kinds of computationally intensive applications. In many applications GPGPU reliability is becoming a serious issue, and several research activities are focusing on its evaluation. This paper offers an overview of some major results in the area. First, it shows and analyzes the results of some experiments assessing GPGPU reliability in HPC datacenters. Second, it provides some recent results derived from radiation experiments about the reliability of GPGPUs. Third, it describes the characteristics of an advanced fault-injection environment, allowing effective evaluation of the resiliency of applications running on GPGPUs.
Keywords :
circuit reliability; computer centres; graphics processing units; GPGPU; HPC data center; advanced fault-injection environment; computational power; general-purpose graphics processing unit; radiation experiment; reliability; Benchmark testing; Graphics processing units; Instruction sets; Laboratories; Neutrons; Performance evaluation; Reliability; GPGPUs; HPC; fault injection; radiation; reliability;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
DOI :
10.7873/DATE.2014.354
