Microprocessor-controlled acquisition system for the determination of MOS transistor parameters

Discusses a microprocessor-controlled data acquisition system for automated acquisition of MOS transistor parameters. The Analog Signal Processor and the Control Interface Circuit are described. Finally, the authors explain the procedure of parameter determination based on the least squares estimation criterion. This procedure is applied to long-channel, surface-channel, enhancement-mode PMOS transistors. The I_D-V_D curves exhibit an accuracy of 1-3 percent compared with the experimental characteristics.