• DocumentCode
    1295376
  • Title

    A dynamic test method for high-resolution A/D converters

  • Author

    Souders, T. Michael

  • Author_Institution
    Electrosystems Division, National Bureau of Standards, Washington, DC 20234
  • Issue
    1
  • fYear
    1982
  • fDate
    3/1/1982 12:00:00 AM
  • Firstpage
    3
  • Lastpage
    5
  • Abstract
    A dynamic test method is described for A/D converters having up to 16 bits of resolution. The technique exercises the test converter with stepped input changes, simulating the output of an S/H amplifier. Dynamic errors as low as 4 ppm can be measured within 4 ßs following a step change as large as 20 V.
  • Keywords
    Feedback loop; Resistance; Resistors; Switches; Switching circuits; Time measurement; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1982.6312502
  • Filename
    6312502
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1295376