DocumentCode
1295390
Title
Estimation of statistical variables for analogue fault detectability evaluation
Author
Papakostas, D.K. ; Hatzopoulos, A.A.
Author_Institution
Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Greece
Volume
146
Issue
6
fYear
1999
fDate
12/1/1999 12:00:00 AM
Firstpage
350
Lastpage
354
Abstract
An efficient method for estimating the mean value and standard deviation of output measurements is introduced. It takes into account statistical variations of component values and gives accurate and realistic results with less computational time compared with the Monte Carlo technique. A method for the estimation of fault detectability of output measurements in a simulation-before-test approach is proposed. Results from four different circuits show the effectiveness of the methods in selecting the measurement with the highest detectability among a given set and also their application for input stimulus selection
Keywords
Monte Carlo methods; analogue integrated circuits; circuit simulation; fault diagnosis; integrated circuit measurement; integrated circuit testing; Monte Carlo technique; analogue fault detectability evaluation; component values; computational time; detectability; fault detectability; input stimulus selection; mean value; simulation-before-test approach; standard deviation; statistical variables;
fLanguage
English
Journal_Title
Circuits, Devices and Systems, IEE Proceedings -
Publisher
iet
ISSN
1350-2409
Type
jour
DOI
10.1049/ip-cds:19990581
Filename
819802
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