Title :
Estimation of statistical variables for analogue fault detectability evaluation
Author :
Papakostas, D.K. ; Hatzopoulos, A.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Greece
fDate :
12/1/1999 12:00:00 AM
Abstract :
An efficient method for estimating the mean value and standard deviation of output measurements is introduced. It takes into account statistical variations of component values and gives accurate and realistic results with less computational time compared with the Monte Carlo technique. A method for the estimation of fault detectability of output measurements in a simulation-before-test approach is proposed. Results from four different circuits show the effectiveness of the methods in selecting the measurement with the highest detectability among a given set and also their application for input stimulus selection
Keywords :
Monte Carlo methods; analogue integrated circuits; circuit simulation; fault diagnosis; integrated circuit measurement; integrated circuit testing; Monte Carlo technique; analogue fault detectability evaluation; component values; computational time; detectability; fault detectability; input stimulus selection; mean value; simulation-before-test approach; standard deviation; statistical variables;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings -
DOI :
10.1049/ip-cds:19990581
