DocumentCode :
129543
Title :
Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures
Author :
Abelein, Ulrich ; Cook, Alan ; Engelke, P. ; Glas, Michael ; Reimann, Felix ; Rodriguez Gomez, Laura ; Russ, Thomas ; Teich, Jurgen ; Ull, Dominik ; Wunderlich, H.-J.
Author_Institution :
AUDI AG, Ingolstadt, Germany
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
6
Abstract :
With ever more complex automotive systems, the current approach of using functional tests to locate faulty components results in very long analysis procedures and poor diagnostic accuracy. Built-In Self-Test (BIST) offers a promising alternative to collect structural diagnostic information during E/E-architecture test. However, as the automotive industry is quite cost-driven, structural diagnosis shall not deteriorate traditional design objectives. With this goal in mind, the work at hand proposes a design space exploration to integrate structural diagnostic capabilities into an E/E-architecture design. The proposed integration is performed non-intrusively, i. e., the addition and execution of tests (a) does not affect any functional applications and (b) does not require any costly changes in the communication schedules.
Keywords :
automotive components; automotive electronics; built-in self test; fault diagnosis; BIST; advanced diagnosis features; automotive E/E-architecture design; automotive industry; built-in self-test; complex automotive systems; design space exploration; faulty component location; functional tests; nonintrusive integration; structural diagnostic information; Automotive engineering; Built-in self-test; Circuit faults; Logic gates; Optimization; Schedules; Space exploration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.373
Filename :
6800574
Link To Document :
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