DocumentCode
129560
Title
Built-in self-test and characterization of polar transmitter parameters in the loop-back mode
Author
Jae Woong Jeong ; Ozev, Sule ; Sen, Satyaki ; Natarajan, Vivek ; Slamani, Mustapha
Author_Institution
Electr. Eng., Arizona State Univ., Tempe, AZ, USA
fYear
2014
fDate
24-28 March 2014
Firstpage
1
Lastpage
6
Abstract
This paper presents a Built-in self-test (BIST) solution for polar transmitters with low cost. Polar transmitters are desirable for portable devices due to higher power efficiency they provide compared to traditional Cartesian transmitters. However, they generally require iterative test/measurement/calibration cycles. The delay skew between the envelope and phase signals and the finite envelope bandwidth can create intermodulation distortion (IMD) that leads to the violation of the spectral mask and error vector magnitude (EVM) requirements. Typically, these parameters are not directly measured but calibrated through spectral performance analysis using expensive RF equipment, leading to lengthy and costly measurement/calibration cycles. Characterization and calibration of these parameters inside the device would reduce the test time and cost considerably. In this paper, we propose a technique to measure the delay skew and the finite envelope bandwidth, two parameters that can be digitally calibrated, based on the measurement of the output of the receiver in the loop-back mode. Simulation and hardware measurement results show that the proposed technique can characterize the targeted impairments in the polar transmitter accurately.
Keywords
built-in self test; calibration; delays; integrated circuit testing; radio transceivers; telecommunication equipment testing; built in self test; delay skew; error vector magnitude; finite envelope bandwidth; intermodulation distortion; loop back mode; phase signals; polar transmitter parameters; portable devices; power efficiency; receiver output measurement; spectral mask; Bandwidth; Baseband; Delays; Radio frequency; Receivers; Transceivers; Transmitters;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location
Dresden
Type
conf
DOI
10.7873/DATE.2014.382
Filename
6800583
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