• DocumentCode
    129560
  • Title

    Built-in self-test and characterization of polar transmitter parameters in the loop-back mode

  • Author

    Jae Woong Jeong ; Ozev, Sule ; Sen, Satyaki ; Natarajan, Vivek ; Slamani, Mustapha

  • Author_Institution
    Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2014
  • fDate
    24-28 March 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents a Built-in self-test (BIST) solution for polar transmitters with low cost. Polar transmitters are desirable for portable devices due to higher power efficiency they provide compared to traditional Cartesian transmitters. However, they generally require iterative test/measurement/calibration cycles. The delay skew between the envelope and phase signals and the finite envelope bandwidth can create intermodulation distortion (IMD) that leads to the violation of the spectral mask and error vector magnitude (EVM) requirements. Typically, these parameters are not directly measured but calibrated through spectral performance analysis using expensive RF equipment, leading to lengthy and costly measurement/calibration cycles. Characterization and calibration of these parameters inside the device would reduce the test time and cost considerably. In this paper, we propose a technique to measure the delay skew and the finite envelope bandwidth, two parameters that can be digitally calibrated, based on the measurement of the output of the receiver in the loop-back mode. Simulation and hardware measurement results show that the proposed technique can characterize the targeted impairments in the polar transmitter accurately.
  • Keywords
    built-in self test; calibration; delays; integrated circuit testing; radio transceivers; telecommunication equipment testing; built in self test; delay skew; error vector magnitude; finite envelope bandwidth; intermodulation distortion; loop back mode; phase signals; polar transmitter parameters; portable devices; power efficiency; receiver output measurement; spectral mask; Bandwidth; Baseband; Delays; Radio frequency; Receivers; Transceivers; Transmitters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.7873/DATE.2014.382
  • Filename
    6800583