Title : 
Panel: Future SoC verification methodology: UVM evolution or revolution?
         
        
            Author : 
Drechsler, Rolf ; Chevallaz, Christophe ; Fummi, F. ; Hu, Alan J. ; Morad, R. ; Schirrmeister, Frank ; Goryachev, Alex
         
        
            Author_Institution : 
DFKI, Univ. of Bremen, Bremen, Germany
         
        
        
        
        
        
            Abstract : 
With increasing design complexity System on Chip (SoC) verification is becoming a more and more important and challenging aspect of the overall development process. The Universal Verification Methodology (UVM) is thereby a common solution to this problem; although it still keeps some problems unsolved. In this panel leading experts from industry (both users and vendors) and academy will discuss the future of SoC verification methodology.
         
        
            Keywords : 
integrated circuit design; system-on-chip; SoC verification methodology; UVM evolution; complexity system on chip verification design; universal verification methodology; Complexity theory; Field programmable gate arrays; Hardware; IP networks; Servers; Software; System-on-chip;
         
        
        
        
            Conference_Titel : 
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
         
        
            Conference_Location : 
Dresden
         
        
        
            DOI : 
10.7873/DATE.2014.385