DocumentCode :
1295735
Title :
Measurement of 1/f noise using a contact-free current-driving scheme
Author :
Hashiguchi, S. ; Suzuki, Yuya
Author_Institution :
Faculty of Engng., Yamanashi Univ., Kofu, Japan
Issue :
3
fYear :
1982
Firstpage :
210
Lastpage :
212
Abstract :
A method is proposed to measure the 1/f noise of resistance materials without using current driving contacts. Alternating current is induced in a ring-shaped sample by an AC magnetic flux. Good agreement was obtained between data using this method and the conventional four-probe method. The contact-free method is superior for measuring the 1/f noise in those materials upon which ohmic contacts are difficult to form.
Keywords :
electric noise measurement; random noise; 1/f noise measurement; contact resistance; contact-free current-driving scheme; random noise; resistance materials; ring-shaped sample; Amplitude modulation; Detectors; Fluctuations; Mixers; Noise; Noise measurement; Resistance;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1982.6312561
Filename :
6312561
Link To Document :
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