• DocumentCode
    1295864
  • Title

    Input Impedance Modeling and Analysis of Line-Commutated Rectifiers

  • Author

    Bing, Zhonghui ; Karimi, Kamiar J. ; Sun, Jian

  • Author_Institution
    Dept. of Electr., Comput., & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
  • Volume
    24
  • Issue
    10
  • fYear
    2009
  • Firstpage
    2338
  • Lastpage
    2346
  • Abstract
    This paper presents the modeling and analysis of small-signal input impedance for line-commutated rectifiers. The recently developed impedance mapping method, which has been applied to single-phase rectifiers with sinusoidal line inputs, is generalized to single-phase rectifiers with distorted lines as well as three-phase rectifiers. The modeling method assumes known impedance of the circuit on the dc side of the rectifier bridge (including its output filter and the load), and determines the corresponding ac input impedance by using a current and voltage mapping function that describes the operation of the rectifier bridge in the frequency domain. In this approach, closed-form analytical expressions are derived for the ac input impedance as functions of the dc circuit impedance. The resulting models are intended for stability analysis and design of large ac power systems involving significant number of rectification loads, such as more-electric aircraft power systems and microgrids. Detailed derivation of the models is presented in this paper. Numerical simulation and experimental measurement results are also presented to validate the developed models.
  • Keywords
    commutators; numerical analysis; rectifying circuits; aircraft power systems; frequency domain; impedance mapping method; input impedance modeling; line-commutated rectifiers; microgrids; numerical simulation; rectifier bridge; single-phase rectifiers; stability analysis; Diode rectifier, impedance modeling, Small-signal analysis, small-signal stability;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2009.2025333
  • Filename
    5200472